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  1. DIGILEM - Interferometric Endpoint Detector & Thin Film Monitor

    Interferometry is a powerful technique that can be used for endpoint detection of planar layer and trench etching, or deposition
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    interferometry1
    film thickness1
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    Digilem0
    etching control0
    semiconductor characterisation0

    www.digilem.com - 2009-02-08

design7 interferometry1 industrial design2 furnace2 film5 overview6 charline teixeira m.0 architettura2 interferometer1 gas3 thermal2 drying1 measurement2 cooling3 charlene zomer0 thin2 metrology2 charlison benschop0 evaporation1 diet3 cleaning3 dry2 arredamento2 fat2

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